The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2013

Filed:

Mar. 05, 2010
Applicants:

Felix E Fernandez, Mayaguez, PR (US);

Nelson Sepulveda-alancastro, Mayaguez, PR (US);

Armando Rua, Yauco, PR (US);

Rafmag Cabrera, Aguas Buenas, PR (US);

Inventors:

Felix E Fernandez, Mayaguez, PR (US);

Nelson Sepulveda-Alancastro, Mayaguez, PR (US);

Armando Rua, Yauco, PR (US);

Rafmag Cabrera, Aguas Buenas, PR (US);

Assignee:

University of Puerto Rico, San Juan, PR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention utilizes the changes in physical properties of materials during a solid-solid phase transition in order to enhance the sensitivity of cantilever IR detectors. The substantial changes in properties during insulator-to-metal transitions (IMTs) of some materials are useful for controlling purposes according to the invention. A cantilever arrangement is provided with a cantilever being coated with an insulator-to-metal transitions (IMTs) material. Bending of the cantilever is achieved when the temperature of the (IMTs) material is within its phase transition temperature range. A Focal Plane Array (FPA) for detecting Infrared (IR) radiation including the cantilever arrangement of the invention is also proposed.


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