The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2013
Filed:
Dec. 29, 2008
Myoung Choul Choi, Ochang-myeon, KR;
Yeon Suk Choi, Daejeon, KR;
Jeong Min Lee, Daejeon, KR;
Seung Yong Kim, Daejeon, KR;
Dong Lak Kim, Daejeon, KR;
Hyun Sik Kim, Daejeon, KR;
Jong Shin Yoo, Daejeon, KR;
Stefan Karl-heinz Stahl, Mettenheim, DE;
Myoung Choul Choi, Ochang-myeon, KR;
Yeon Suk Choi, Daejeon, KR;
Jeong Min Lee, Daejeon, KR;
Seung Yong Kim, Daejeon, KR;
Dong Lak Kim, Daejeon, KR;
Hyun Sik Kim, Daejeon, KR;
Jong Shin Yoo, Daejeon, KR;
Stefan Karl-Heinz Stahl, Mettenheim, DE;
Korea Basic Science Institute, Daejeon, KR;
Abstract
A Fourier transform ion cyclotron resonance mass spectrometer (FT-ICR MS) is provided. A preamplifier is installed as nearest to an ion cyclotron resonance (ICR) trap as possible at a detector part in the mass spectrometer, and thermal noise generated at the preamplifier is minimized by means of a cryo-cooling system to increase a signal-to-noise ratio of ion detection signals such that an ultra-low amount of specimen can be detected, which was impossible in the related art.