The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2013

Filed:

Apr. 07, 2010
Applicants:

Feyzi Inanc, Spring, TX (US);

W. Allen Gilchrist, Jr., Houston, TX (US);

Inventors:

Feyzi Inanc, Spring, TX (US);

W. Allen Gilchrist, Jr., Houston, TX (US);

Assignee:

Baker Hughes Incorporated, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 5/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An instrument for performing measurements downhole, includes an irradiator oriented to irradiate sub-surface materials surrounding the instrument, the irradiator including at least one neutron source disposed proximate to a moderator for providing a source of inelastic gamma photons and also disposed proximate to a material for providing a source of capture gamma photons; and a first detector and a second detector, each detector for detecting gamma rays and oriented in a relationship to the irradiator for receiving gamma photons from at least one of the irradiator and the formation. A method for irradiating sub-surface materials is provided.


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