The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2013
Filed:
Mar. 08, 2006
Junzhong Liang, Fremont, CA (US);
Junzhong Liang, Fremont, CA (US);
Abstract
Aberration-induced vision symptoms are determined by obtaining at least one wave aberration of an eye, calculating at least one point-spread function from the wave aberration, convolving the point-spread function of eye with at least one specially designed image for night vision diagnosis, and determining at least one aberration-induced vision symptom of the tested eye from the convolved images. The specially designed images are for vision diagnosis of aberration-induced glare, halo, ghost image, and starburst. The invention methods for specifying aberration-induced symptoms allow to find an optimized refractive corrections of defocus and astigmatism and to reduce vision symptoms caused by aberrations in the eye.