The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2013
Filed:
Feb. 21, 2008
Makoto Takahashi, Sapporo, JP;
Takehiko Ohura, Sapporo, JP;
Yukiko Inamoto, Takamatsu, JP;
Takashi Kamakura, Kita-gun, JP;
Shigeyuki Inamoto, Takamatsu, JP;
Makoto Takahashi, Sapporo, JP;
Takehiko Ohura, Sapporo, JP;
Yukiko Inamoto, Takamatsu, JP;
Takashi Kamakura, Kita-gun, JP;
Shigeyuki Inamoto, Takamatsu, JP;
Teikoku Seiyaku Co., Ltd., Kagawa, JP;
Abstract
An apparatus and a method for simulatively measuring an environment in a microspace between human skin and a wound dressing. The simulative environment-measuring apparatus includes a constant temperature-and-humidity chamber (); a heat exchanger () disposed in the chamber; a constant temperature water bath () and a pump () for supplying warm water to the heat exchanger; and a container () set on the heat exchanger. The container holds a water retentive member () therein, and is covered with a water vapor diffusion-controlling member (). A microspace () formed between the water vapor diffusion-controlling member and a wound dressing () is a simulatively reproduced space between human skin and the wound dressing. A thin temperature-and-humidity sensor () is set in the microspace to measure temperature and humidity. When plural containers are used, the environments of plural wound dressings can be measured at once.