The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8438661 B1

PDF
Full Text
Expired
Date of Patent:
May. 07, 2013

Filed:

Oct. 18, 2007
Applicants:

David Hermanus Adrianus Blank, Enschede, NL;

Augustinus Josephus Helena Maria Rijnders, Lichtenvoorde, NL;

Joska Johannes Broekmaat, Nijmegen, NL;

Frank Johan Gerhardus Roesthuis, Oldenzaal, NL;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/20 (2010.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a scanning probe microscope comprising: a specimen holder holding a specimen; and a probe for scanning the relief of the upper surface of the specimen, which probe is movable in a vertical direction and two orthogonal horizontal directions, wherein the upper surface of the specimen is tilted relative to at least one of the two orthogonal horizontal directions.


Find Patent Forward Citations

Blank, David Hermanus Adrianus. (2013). Scanning probe microscope (U.S. Patent No. 8438661). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8438661

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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