The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2013

Filed:

Dec. 18, 2008
Applicant:

David Noeldner, Fort Collins, CO (US);

Inventor:

David Noeldner, Fort Collins, CO (US);

Assignee:

LSI Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described embodiments provide an apparatus for calculating an N-point discrete Fourier transform of an input signal having multiple sample values. The apparatus includes at least one input configured to receive the sample values and a counter to count sample periods. Also included are at least two parallel multipliers to multiply each sample value, with each of the multipliers having a corresponding multiplication factor. There is at least one multiplexer to select one of the at least two parallel multipliers. An adder sums the scaled sample values and an accumulator accumulates the summed sample values. N is an integer and the at least two parallel multipliers are selectable based upon the value of N and the value of the sample period count.


Find Patent Forward Citations

Loading…