The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2013
Filed:
Jun. 28, 2010
Chih-kuang Chang, Taipei Hsien, TW;
Zhong-kui Yuan, Shenzhen, CN;
Dong-hai LI, Shenzhen, CN;
LI Jiang, Shenzhen, CN;
Yong-hong Ding, Shenzhen, CN;
Chih-Kuang Chang, Taipei Hsien, TW;
Zhong-Kui Yuan, Shenzhen, CN;
Dong-Hai Li, Shenzhen, CN;
Li Jiang, Shenzhen, CN;
Yong-Hong Ding, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
In a method for verifying manufacturing accuracy, a point cloud of a workpiece is read. A first determined point is determined according to the first point of the point cloud and a second determined point is determined according to the final point of the point cloud. A first line, a second line, and a third line are all located by respectively connecting the first point and the first determined point, the final point and the second determined point, and the first determined point and the second determined point. Qualification of the workpiece is determined by measuring a first angle of the first line and the third line, a second angle of the second line and the third line, a first distance between the first determined point and the second line, and a second distance between the second determined point and the first line.