The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2013

Filed:

Jul. 07, 2010
Applicants:

Nicholas J. Ploplys, Redondo Beach, CA (US);

Brian A. Cronin, Hermosa Beach, CA (US);

Samuel S. Blackman, Los Angeles, CA (US);

Inventors:

Nicholas J. Ploplys, Redondo Beach, CA (US);

Brian A. Cronin, Hermosa Beach, CA (US);

Samuel S. Blackman, Los Angeles, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring sensor bias and a method for estimating sensor bias is provided. Road location data is obtained. Sensor observation data is obtained. A sensor observation is identified that corresponds to an on-road target moving on a known road. A measurement of one-dimensional sensor bias is formed. As one-dimensional sensor bias measurements accumulate, multi-dimensional sensor bias is estimated. Sensor bias estimates may then be incorporated into a multiple hypothesis tracker system.


Find Patent Forward Citations

Loading…