The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2013
Filed:
Nov. 24, 2009
David A. Donovan, Oakland, CA (US);
Justin Gregg, San Francisco, CA (US);
David A. Donovan, Oakland, CA (US);
Justin Gregg, San Francisco, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Test systems are provided for performing testing and calibration operations on wireless circuitry in electronic devices. The electronic devices may include cellular telephones and other portable electronic devices. Wireless circuitry in a device may include a radio-frequency transceiver that is controlled based on radio-frequency transceiver control signals. The wireless circuitry may also include power amplifier circuitry. The power amplifier circuitry may receive radio-frequency signals from the transceiver and may produce correspondingly amplified radio-frequency output signals for wireless transmission with an antenna. The power amplifier circuitry may be powered by a bias voltage. The test systems may provide the electronic device with a transmit power request that directs the electronic device to produce a desired output power. The test systems may measure the actual resulting power. After sufficient measurements have been made, the test systems may calibrate the transceiver and power amplifier settings.