The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2013

Filed:

Nov. 14, 2003
Applicants:

Maxim Fradkin, Paris, FR;

Jean-michel Rouet, Paris, FR;

Shérif Makram-ebeid, Dampierre, FR;

Inventors:

Maxim Fradkin, Paris, FR;

Jean-Michel Rouet, Paris, FR;

Shérif Makram-Ebeid, Dampierre, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing system having means of automatic adaptation of 3-D surface Model to image features, for Model-based image segmentation, comprising: dynamic adaptation means for adapting the Model resolution to image features including locally setting higher resolution when reliable image features are found and setting lower resolution in the opposite case. This system comprises estimation means for estimating a feature confidence parameter for each image feature. The model resolution is locally adapted according to said parameter. The feature confidence parameter depends on the feature distance and on the estimation of quality of this feature including estimation of noise. The large distances and the noisy, although close features are penalized. The resolution of the Model is decreased in absence of confidence and is gradually increased with the rise of feature confidence.


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