The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2013
Filed:
May. 14, 2012
Weilin Hou, Slidell, LA (US);
Alan Weidemann, Carriere, MS (US);
Weilin Hou, Slidell, LA (US);
Alan Weidemann, Carriere, MS (US);
The United States of America, as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A method for simultaneously optimizing a digital image taken in or through a scattering medium and obtaining information regarding optical properties of the scattering medium is provided. Digital image data are received by a computer. The digital image is evaluated according to an objective image quality metric and a resulting image quality value is compared to a previously stored image quality value for the image. A revised optical transfer function is derived by modeling the optical properties of the medium to be used to generate a restored digital image, which is derived from the original image and the revised optical transfer function. The restored digital image is evaluated according to the objective image quality metric and an optimized restored image is identified. The optical properties associated with the optical transfer function producing the optimized restored image represent a close approximation of the true optical properties of the medium.