The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2013
Filed:
Sep. 21, 2009
Haiyan Sun, Niskayuna, NY (US);
Yuri Alexeyevich Plotnikov, Niskayuna, NY (US);
Changting Wang, Niskayuna, NY (US);
Shridhar Champaknath Nath, Niskayuna, NY (US);
Aparna Chakrapani Sheila-vadde, Bangalore, IN;
Haiyan Sun, Niskayuna, NY (US);
Yuri Alexeyevich Plotnikov, Niskayuna, NY (US);
Changting Wang, Niskayuna, NY (US);
Shridhar Champaknath Nath, Niskayuna, NY (US);
Aparna Chakrapani Sheila-Vadde, Bangalore, IN;
General Electric Company, Niskayuna, NY (US);
Abstract
A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.