The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2013
Filed:
Jul. 31, 2007
Stuart A. Solin, St. Louis, MO (US);
Kirk D. Wallace, St. Louis, MO (US);
Samuel A. Wickline, St. Louis, MO (US);
Michael S. Hughes, Wildwood, MO (US);
Stuart A. Solin, St. Louis, MO (US);
Kirk D. Wallace, St. Louis, MO (US);
Samuel A. Wickline, St. Louis, MO (US);
Michael S. Hughes, Wildwood, MO (US);
Washington University, St. Louis, MO (US);
Abstract
Disclosed herein is an apparatus for sensing characteristics of an object. In a preferred embodiment, the apparatus comprises an array, wherein the array comprises a plurality of nanoscale hybrid semiconductor/metal devices which are in proximity to an object, each hybrid semiconductor/metal device being configured to produce a voltage in response to a perturbation, wherein the produced voltage is indicative of a characteristic of the object. Any of a variety of nanoscale EXX sensors can be selected as the hybrid semiconductor/metal devices in the array. With such an array, ultra high resolution images of nanoscopic resolution can be generated of objects such as living cells, wherein the images are indicative of a variety of cell biologic processes.