The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2013
Filed:
Oct. 08, 2008
Naoko Inadama, Chiba, JP;
Hideo Murayama, Chiba, JP;
Kengo Shibuya, Chiba, JP;
Fumihiko Nishikido, Chiba, JP;
Taiga Yamaya, Chiba, JP;
Eiji Yoshida, Chiba, JP;
Naoko Inadama, Chiba, JP;
Hideo Murayama, Chiba, JP;
Kengo Shibuya, Chiba, JP;
Fumihiko Nishikido, Chiba, JP;
Taiga Yamaya, Chiba, JP;
Eiji Yoshida, Chiba, JP;
National Institute of Radiological Sciences, Chiba, JP;
Abstract
This aims to provide a DOI type radiation detector in which scintillation crystals arranged two-dimensionally on a light receiving surface to form rectangular section groups in extending directions of the light receiving surface of a light receiving element are stacked up to make a three-dimensional arrangement and responses of the crystals that have detected radiation are made possible to identify at response positions on the light receiving surface, so that a three-dimensional radiation detection position can be obtained. In the DOI type radiation detector, scintillation crystals are right triangle poles extending upwards from the light receiving surface and the response positions on the light receiving surface are characterized. With this structure, DOI identification of a plurality of layers can be carried out by simply performing an Anger calculation of a light receiving element signal.