The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2013

Filed:

Apr. 07, 2010
Applicants:

Feyzi Inanc, Spring, TX (US);

W. Allen Gilchrist, Jr., Houston, TX (US);

Inventors:

Feyzi Inanc, Spring, TX (US);

W. Allen Gilchrist, Jr., Houston, TX (US);

Assignee:

Baker Hughes Incorporated, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 5/00 (2006.01); G01V 5/08 (2006.01); G01V 5/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for performing a measurement of a property downhole includes: using an instrument including an irradiator including a pulsed neutron generator, a moderator and a material including a high cross section for capturing thermal neutrons downhole, generating inelastic gamma photons from neutron interactions in the moderator and generating capture gamma photons from neutron interactions in the material; irradiating sub-surface materials proximate to the instrument with the inelastic gamma photons and the capture gamma photons; detecting radiation scattered by the sub-surface materials; and estimating the property according to the detected radiation. A system is also disclosed.


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