The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2013
Filed:
Aug. 12, 2009
Volker Dreyer, Lorrach, DE;
Armin Wernet, Rheinfelden, DE;
Volker Dreyer, Lorrach, DE;
Armin Wernet, Rheinfelden, DE;
Endress + Hauser GmbH + Co. KG, Maulburg, DE;
Abstract
A method for manufacturing a measuring apparatus for capacitive determining and/or monitoring of at least the fill level of a medium. The measuring apparatus has a probe unit and an electronics unit. During a measurement, the electronics unit supplies the probe unit with an exciter signal and receives from the probe unit a received signal, from which the electronics unit ascertains a capacitance value. The probe unit is coated with an insulation layer, the coated probe unit is connected with the electronics unit and inserted into a container containing a calibration medium, the coated probe unit is covered completely by the calibration medium and an associated received signal is gained, and, with the associated received signal, at least one adjustable component of the electronics unit is set.