The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2013
Filed:
Jun. 14, 2009
Dakshi Agrawal, Monsey, NY (US);
Animashree Anandkumar, Cambridge, MA (US);
Chatschik Bisdikian, Chappaqua, NY (US);
Ting He, Ossining, NY (US);
Shoel Perelman, New York, NY (US);
Dakshi Agrawal, Monsey, NY (US);
Animashree Anandkumar, Cambridge, MA (US);
Chatschik Bisdikian, Chappaqua, NY (US);
Ting He, Ossining, NY (US);
Shoel Perelman, New York, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Systems and methods provide a selective instrumentation strategy for monitoring the progress of transactions in a distributed computing system. The monitoring of the transactive processing of jobs is considered through a collection of computer operating stages in a distributed system, using limited information. The monitoring is performed by observing log records (or footprints) produced during each stage of processing in the system. The footprints lack unique transaction identifiers resulting in uncertainties in monitoring transaction instances. The processing stages are selective instrumented to reduce monitoring uncertainty under the given constraints such as limited budget for instrumentation cost.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile