The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2013

Filed:

Jun. 30, 2010
Applicants:

Shinyen Liu, Taiping, TW;

Chuntai Yen, Taipei, TW;

Hsiaowei Chen, Bade, TW;

Inventors:

ShinYen Liu, Taiping, TW;

ChunTai Yen, Taipei, TW;

HsiaoWei Chen, Bade, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 11/01 (2006.01); G06F 19/00 (2006.01); G06F 7/00 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for managing machine tools are provided. When a current abnormality occurs in one of at least one machine tool, a specific failure category is determined according to the current abnormality, and at least one suggested combination of parameters is generated according to the specific failure category and a transaction database, wherein the specific failure category is one of a plurality of predefined failure categories, and each suggested combination of parameters includes a plurality of associated parameters, which are commonly retrieved for the specific failure category. Each transaction data in the transaction database records a plurality of parameters corresponding to a failure category, wherein the parameters are the parameters whose parameter values are retrieved from the at least one machine tool, having the abnormality according to the failure category.


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