The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2013
Filed:
Nov. 03, 2009
Toyoo Ilda, Nagaokakyo, JP;
Kengo Ichimura, Toyonaka, JP;
Junichiro Ueki, Nara, JP;
Kazuhiro Shono, Kyoto, JP;
Yoshizo Togawa, Kyoto, JP;
Akira Ishida, Shizuoka, JP;
Toyoo Ilda, Nagaokakyo, JP;
Kengo Ichimura, Toyonaka, JP;
Junichiro Ueki, Nara, JP;
Kazuhiro Shono, Kyoto, JP;
Yoshizo Togawa, Kyoto, JP;
Akira Ishida, Shizuoka, JP;
Omron Corporation, Kyoto, JP;
Abstract
A polygonal mark M having a shape in which a direction can be uniquely specified is attached to a predetermined area of an actual model WM of a work to be three-dimensionally recognized. A process of changing the orientation of the actual model WM such that a state in which the mark M is contained in the view of each camera is maintained, and then performing the three-dimensional measurement is executed over a plurality of times. A predetermined number of, or two or more pieces of three-dimensional information is selected from the three-dimensional information restored by each measurement, these pieces of three-dimensional information are aligned and integrated, the information corresponding to the mark is deleted or invalidated from the integrated three-dimensional information, and the three-dimensional information after such a process is set as a three-dimensional model.