The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2013
Filed:
Oct. 15, 2009
Liyan Yin, Shenzhen, CN;
Liyan Yin, Shenzhen, CN;
Huawei Technologies Co., Ltd., Shenzhen, CN;
Abstract
A measurement processing method is provided. The method includes performing physical layer filtering on measurement sample data obtained in measurement to obtain measurement values. Time-frequency domain normalization filtering may be performed on the obtained measurement values to obtain a measurement result, which, in turn may be evaluated. A measurement processing apparatus is further provided. The measurement processing solutions solve problems in the prior art such as that time domain and frequency domain characteristics of the measurement values are not considered when Layer 3 filtering is performed, and that the system must process more measurement sample data if Layer 3 filtering is not used. In the solutions, time-frequency domain normalization filtering is performed on the measurement values obtained after physical layer filtering to obtain a final measurement result, so that a more accurate measurement result is obtained, thus optimizing the network performance.