The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2013
Filed:
Dec. 30, 2010
Woo-sik Jeong, Gyeonggi-do, KR;
Kang-chil Lee, Gyeonggi-do, KR;
Jeong-ho Cho, Gyeonggi-do, KR;
Kyoung-shub Lee, Gyeonggi-do, KR;
Il-kwon Kang, Gyeonggi-do, KR;
Sungho Kang, Seoul, KR;
Joo Hwan Lee, Seoul, KR;
Woo-Sik Jeong, Gyeonggi-do, KR;
Kang-Chil Lee, Gyeonggi-do, KR;
Jeong-Ho Cho, Gyeonggi-do, KR;
Kyoung-Shub Lee, Gyeonggi-do, KR;
Il-Kwon Kang, Gyeonggi-do, KR;
Sungho Kang, Seoul, KR;
Joo Hwan Lee, Seoul, KR;
Hynix Semiconductor Inc., Gyeonggi-do, KR;
Abstract
A device for storing error information of a memory device includes a plurality of parent memories and a plurality of child memories. Each of the parent memories stores a row address and a column address of one defective cell. Each of the child memories stores a column address of a defective cell, having a row address identical to a row address stored in the corresponding parent memory, or a row address of a defective cell, having a column address identical to a column address stored in the corresponding parent memory. Herein, each of the parent memories stores information about information about whether a row repair must be performed to repair a defective cell stored in the parent memory and information about whether a column repair must be performed to repair a defective cell stored in the parent memory.