The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2013

Filed:

Mar. 18, 2009
Applicant:

Kazuyuki Sakurai, Tokyo, JP;

Inventor:

Kazuyuki Sakurai, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a detection system including a stripe pattern foreground filtering unit, a stripe pattern background filtering unit, a stripe pattern integration filtering unit, an isolated feature point removal unit, a stripe pattern area detection unit and a stripe pattern area outputting unit. The detection system utilizes a stripe pattern area filter value that directly exploits the shape of the stripe pattern in the local processing of each pixel in an image to detect the stripe pattern area.


Find Patent Forward Citations

Sakurai, Kazuyuki. (2013). Stripe pattern detection system, stripe pattern detection method, and program for stripe pattern detection (U.S. Patent No. 8432447). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8432447

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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