The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2013
Filed:
May. 20, 2008
Gopal B. Avinash, Menomonee Falls, WI (US);
Saad Ahmed Sirohey, Pewaukee, WI (US);
Fausto J. Espinal, Waukesha, WI (US);
Zhongmin Lin, New Berlin, WI (US);
Ananth Mohan, Waukesha, WI (US);
Tamanna Bembenek, Naperville, IL (US);
Gopal B. Avinash, Menomonee Falls, WI (US);
Saad Ahmed Sirohey, Pewaukee, WI (US);
Fausto J. Espinal, Waukesha, WI (US);
Zhongmin Lin, New Berlin, WI (US);
Ananth Mohan, Waukesha, WI (US);
Tamanna Bembenek, Naperville, IL (US);
General Electric Company, Schenectady, NY (US);
Abstract
A data processing technique is provided. In one embodiment, a computer-implemented method includes accessing reference deviation maps for a plurality of disease types. The reference deviation maps may include subsets of maps associated with severity levels of respective disease types, and a disease severity score may be associated with each severity level. The method may include selecting patient severity levels for multiple disease types based on the subsets of reference deviation maps. Also, the method may include automatically calculating a combined patient disease severity score based at least in part on the disease severity scores associated with the selected patient severity levels, and may include outputting a report based at least in part on the combined patient disease severity score. Additional methods, systems, and manufactures are also disclosed.