The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2013
Filed:
Nov. 08, 2011
Yoav Weizman, Kfar Vitkin, IL;
Lior Aviv, Hertzelia, IL;
Shai Shperber, Bat Hefer, IL;
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method for evaluating temperature is disclosed. The method includes setting a configuration of a configurable delay line out of multiple possible configurations, and delaying a first input signal by a temperature sensitive delay line, delaying a second input signal by the configurable delay line. The configurable delay line is less sensitive to temperature than the temperature sensitive delay line. The method also includes detecting, by a phase detector, a delay difference between a delay introduced by the temperature sensitive delay line and a delay introduced by the configurable delay line, repeating the setting, delaying of the first input signal, delaying of the second input signal and detecting, until the delay difference is below a threshold, and evaluating the temperature of the temperature sensitive delay line in response to a configuration of the configurable delay line that results in the delay difference that is below the threshold.