The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2013

Filed:

Nov. 14, 2011
Applicants:

Rong Liu, Centereach, NY (US);

David Tsi-shi, Stony Brook, NY (US);

Jean Tu, Stony Brook, NY (US);

Michael Veksland, Mount Laurel, NJ (US);

Inventors:

Rong Liu, Centereach, NY (US);

David Tsi-Shi, Stony Brook, NY (US);

Jean Tu, Stony Brook, NY (US);

Michael Veksland, Mount Laurel, NJ (US);

Assignee:

Symbol Technologies, Inc., Holtsville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for imaging a target, includes a housing having a presentation area, a solid-state imaging sensor having an imaging array of image sensors looking at a field of view that extends through the presentation area to the target, and an imaging lens assembly for capturing return light over the field of view from the target through the presentation area, and for projecting the captured return light onto the imaging array during imaging of the target. The assembly has a plurality of lenses, an aperture stop, and a holder for holding the lenses and the aperture stop in spaced relation along an optical axis. The aperture stop has a non-rotationally symmetrical aperture through which the optical axis extends. Alignment elements on the imaging lens assembly are used to align the non-rotationally symmetrical aperture with the imaging array.


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