The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8429615 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 23, 2013

Filed:

Sep. 10, 2008
Applicants:

Shuichi Kunie, Kanagawa, JP;

Hiroki Machimura, Kanagawa, JP;

Inventors:

Shuichi Kunie, Kanagawa, JP;

Hiroki Machimura, Kanagawa, JP;

Assignee:

Renesas Electronics Corporation, Kawasaki-shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object of the present invention is to solve a problem that, if the state of a macro that is a debug target changes by a factor other than a debugger while the debugger debugs the macro as a target, the debugger becomes unable to continue debugging and the debugging terminates abnormally. In order to solve the aforementioned problem, disclosed is a semiconductor integrated circuit including a first register that stores a value indicating that the macro is in a reset state in response to a reset signal received during debugging of the macro, and a second register that stores a value indicating whether or not the macro has been in the reset state in the past by receiving a reset signal.


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Kunie, Shuichi. (2013). Semiconductor integrated circuit (U.S. Patent No. 8429615). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8429615

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