The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8429614 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 23, 2013

Filed:

Jun. 23, 2008
Applicants:

Liang-jie Zhang, Cortlandt Manor, NY (US);

Zhong Jie LI, Beijing, CN;

Jun Zhu, Beijing, CN;

Nagaraj Chinni, Bangalore, IN;

Gopal Kittur, Bangalore, IN;

Naomi M. Mitsumori, San Jose, CA (US);

Inventors:

Liang-Jie Zhang, Cortlandt Manor, NY (US);

Zhong Jie Li, Beijing, CN;

Jun Zhu, Beijing, CN;

Nagaraj Chinni, Bangalore, IN;

Gopal Kittur, Bangalore, IN;

Naomi M. Mitsumori, San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, system and apparatus for generating test data for web services testing load a selected file describing one or more web services operations into memory, select an operation specified in said loaded file, and identify one or more fields used in said operation. The one or more fields are customized and the customization is validated. Generation rules are configured and one or more variations of the fields are generated.


Find Patent Forward Citations

Zhang, Liang-Jie. (2013). Method and apparatus of effective functional test data generation for web service testing (U.S. Patent No. 8429614). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8429614

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