The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2013
Filed:
Mar. 07, 2011
Gary Yu-kwun Kwan, Santa Cruz, CA (US);
Jimmy Soon Yoong Yeap, Island Glades, MY;
Gary Yu-Kwun Kwan, Santa Cruz, CA (US);
Jimmy Soon Yoong Yeap, Island Glades, MY;
Altera Corporation, San Jose, CA (US);
Abstract
Methods and apparatus useful for improving the performance of testing and diagnostic operations on user circuit designs potentially across multiple phases of the development lifecycle and across multiple implementation technologies are described. As one example, a single testing and diagnostic stimulus source can variously provide test pattern data to different potential instantiations of the user circuit design by supporting and selectively utilizing a number of DUT-facing communication channels.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile