The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2013
Filed:
Jul. 28, 2010
Takayuki Nagai, Machida, JP;
Masashi Kunii, Yokohama, JP;
Mineyoshi Masuda, Kawasaki, JP;
Takaki Kuroda, Machida, JP;
Takayuki Nagai, Machida, JP;
Masashi Kunii, Yokohama, JP;
Mineyoshi Masuda, Kawasaki, JP;
Takaki Kuroda, Machida, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
There is provided a failure analysis function capable of reducing the time required to resolve a failure in a piece of equipment to be monitored. When the failure analysis function senses that the status of a piece of equipment which had been abnormal has returned to normal, it displays, of failure analysis results, one based on an equipment abnormality which has been resolved in a GUI separately from the other analysis results. If a failure analysis result is derived based on a plurality of failure events, the failure analysis function displays the failure analysis result in the GUI separately from the other failure analysis results when all of the failure events are confirmed to be resolved (see FIG.).