The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

May. 29, 2009
Applicants:

Wenfei Fan, Wayne, PA (US);

Ming Xiong, Bridgewater, NJ (US);

Inventors:

Wenfei Fan, Wayne, PA (US);

Ming Xiong, Bridgewater, NJ (US);

Assignee:

Alcatel Lucent, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus are provided for propagating functional dependencies with conditions. Propagation covers are computed using an SPC view of a dataset, wherein the SPC view comprises selection, projection and Cartesian product operations. Selection operations are processed to extract equivalence classes. Cartesian product operations are processed to obtain a renamed set of the plurality of conditional functional dependencies, that have attributes appearing in the SPC view. Domain constraints from the equivalence classes are applied to the renamed set to remove attributes not in the SPC view. Projection operations are processed using a reduction by resolution procedure to identify inferences that can be propagated to the SPC view from the conditional functional dependencies having attributes that do not appear in the SPC view. Domain constraints of the equivalence classes are converted to conditional functional dependencies; and a minimal cover of the SPC view is determined.


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