The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2013
Filed:
May. 11, 2012
John Douglas Birdwell, Oak Ridge, TN (US);
Carl G. Sapp, Columbia, SC (US);
Tse-wei Wang, Oak Ridge, TN (US);
David J. Icove, Knoxville, TN (US);
Roger Horn, Knoxville, TN (US);
Mark S. Rader, Huntsville, AL (US);
Dale V. Stansberry, Oak Ridge, TN (US);
John Douglas Birdwell, Oak Ridge, TN (US);
Carl G. Sapp, Columbia, SC (US);
Tse-wei Wang, Oak Ridge, TN (US);
David J. Icove, Knoxville, TN (US);
Roger Horn, Knoxville, TN (US);
Mark S. Rader, Huntsville, AL (US);
Dale V. Stansberry, Oak Ridge, TN (US);
The United States of America as Represented by the Secretary of the Army, Washington, DC (US);
University of Tennessee Research Foundation, Knoxville, TN (US);
Abstract
Method and apparatus for determining a metric for use in predicting properties of an unknown specimen belonging to a group of reference specimen electrical devices comprises application of a network analyzer for collecting impedance spectra for the reference specimens and determining centroids and thresholds for the group of reference specimens so that an unknown specimen may be confidently classified as a member of the reference group using the metric. If a trait is stored with the reference group of electrical device specimens, then, the trait may be predictably associated with the unknown specimen along with any traits identified with the unknown specimen associated with the reference group.