The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Apr. 13, 2010
Applicants:

Noriyasu Nakayama, Kawasaki, JP;

Nobukazu Koizumi, Kawasaki, JP;

Tomoki Kato, Kawasaki, JP;

Naoki Yuzawa, Kawasaki, JP;

Hiroyuki Hieda, Kawasaki, JP;

Satoshi Hiramoto, Oyama, JP;

Inventors:

Noriyasu Nakayama, Kawasaki, JP;

Nobukazu Koizumi, Kawasaki, JP;

Tomoki Kato, Kawasaki, JP;

Naoki Yuzawa, Kawasaki, JP;

Hiroyuki Hieda, Kawasaki, JP;

Satoshi Hiramoto, Oyama, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A simulation method includes obtaining an execution log generated while a predetermined processing is executed by simulating a series of operations in a test model that is a modeled version of a test target device by causing a predetermined processing to be executed in the test model, extracting a processing unit log constituted by a predetermined processing unit from the execution log obtained in the obtaining, and simulating an operation in which processing corresponding to the processing unit log extracted in the extracting is executed in a test model in which a part of function of the test target device is modified, the operation being simulated on the basis of a setting condition set by a user.


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