The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2013
Filed:
Sep. 08, 2009
Sun-hua Pao, Taipei, TW;
Yio-wha Shau, Taipei, TW;
Ming-chien Yu, Taipei, TW;
Chien-lun Tseng, Taipei, TW;
Sun-Hua Pao, Taipei, TW;
Yio-Wha Shau, Taipei, TW;
Ming-Chien Yu, Taipei, TW;
Chien-Lun Tseng, Taipei, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A multi-dimensional empirical mode decomposition method is provided. The method can be applied in image texture analysis, such as medical image analysis. The method can adaptively decompose a three-dimensional image into a number of characteristic image layers and extract characteristic images showing more noticeable textures from the layers. The method uses the physical concept of field to perform the data mode decomposition to obtain envelope and tendency estimation of multi-dimensional data. The method can also be applied in time and frequency analysis of two-dimensional data or multi-channel data.