The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8428339 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 23, 2013

Filed:

Nov. 05, 2009
Applicants:

Xiaoguang Wang, Alpharetta, GA (US);

Lei Wang, Shrewsbury, MA (US);

Inventors:

Xiaoguang Wang, Alpharetta, GA (US);

Lei Wang, Shrewsbury, MA (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for high-speed alignment and inspection of components, such as BGA devices, having non-uniform features is provided. During training time of a machine vision system, a small subset of alignment significant blobs along with a quantum of geometric analysis for picking granularity is determined. Also, during training time, balls may be associated with groups, each of which may have its own set of parameters for inspection.


Find Patent Forward Citations

Wang, Xiaoguang. (2013). System and method for alignment and inspection of ball grid array devices (U.S. Patent No. 8428339). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8428339

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