The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2013
Filed:
Feb. 16, 2012
Anthony Wen GE, Thousand Oaks, CA (US);
Robert Lea Jackson, Moorpark, CA (US);
Anthony Wen Ge, Thousand Oaks, CA (US);
Robert Lea Jackson, Moorpark, CA (US);
Quality Vision International, Inc., Rochester, NY (US);
Abstract
A method of forming a combined feature boundary based on boundaries of first and second overlapping features includes dividing the boundaries of the first and second overlapping features into line segments of known shape, identifying crossing points formed by the line segments, calculating parametric coordinates of the crossing points, and determining a sequence of crossing point evaluation based on the parametric coordinates. The method also includes calculating first and second cross products based on the line segments forming first and second crossing points in the determined sequence, and choosing first and second paths of the combined feature boundary according to mathematical signs of the cross products, wherein the combined feature boundary includes the first and second crossing points and portions of at least one of the first and second feature boundaries defining the first and second paths.