The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Sep. 13, 2010
Applicants:

Tai-chang Yang, Kaohsiung County, TW;

Hong-long Chou, Taipei, TW;

Inventors:

Tai-Chang Yang, Kaohsiung County, TW;

Hong-Long Chou, Taipei, TW;

Assignee:

Altek Corporation, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object image correction apparatus and method for object identification are disclosed. The object image correction method is firstly used for correcting a face or an object under a right position. For example, in order to reduce time consumption for facial identification, the method corrects the deviations such as a rotation, direction, and scaling before an identification process. Preferably, an image is retrieved in a first step. One or more object positions are then detected. Next, some positions of the features are found, and the positions of plural feature points thereon are computed. The method then goes to determine the degree of deviations for the object based on the positions of feature points. Moreover, one or in combination of a rotation correction, a scaling correction, a direction correction, and a shift correction is introduced to process the correction on each deviation. The positions of the feature points are consequently obtained.


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