The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2013
Filed:
Nov. 15, 2010
Kristian R. Peschmann, Torrance, CA (US);
Kristian R. Peschmann, Torrance, CA (US);
Rapiscan Systems, Inc., Torrance, CA (US);
Abstract
This specification is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials ('SNM') and/or high atomic number materials. The system employs a dual energy CT scanning first stage inspection system and advanced image processing techniques to analyze images of an object under inspection ('OUI'), which includes, but is not limited to baggage, parcels, vehicles and cargo.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile