The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Jul. 06, 2011
Applicants:

Frank Dennerlein, Forchheim, DE;

Bernhard Scholz, Heroldsbach, DE;

Inventors:

Frank Dennerlein, Forchheim, DE;

Bernhard Scholz, Heroldsbach, DE;

Assignee:

Siemens Aktiengesellschaft, München, unknown;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for reconstruction of a three-dimensional image data set from projection images of an object captured with an X-ray device from different projection angles is proposed. At least one sub-area of the object is outside the coverage of the X-ray device, or as a result of strong attenuation by a metal so that no projection data is present in the sub-area. Filter lines are determined n the projection images. A first local transformation is performed along the filter lines on the projection images. The missing projection data on the transformed projection data is augmented. A non-local transformation is performed on the transformed projection data for determining of filtered, augmented projection data. The non-local transformation is different from a ramp filter which is created by the first local transformation and the non-local transformation. The three-dimensional image data set is determined by back-projection of the filtered, augmented projection data.


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