The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2013
Filed:
Jan. 14, 2011
Martin Hacker, Jena, DE;
Christoph Hauger, Aalen, DE;
Keith O'hara, Livermore, CA (US);
Scott Meyer, Livermore, CA (US);
Martin Hacker, Jena, DE;
Christoph Hauger, Aalen, DE;
Keith O'Hara, Livermore, CA (US);
Scott Meyer, Livermore, CA (US);
Carl Zeiss Meditec AG, Jena, DE;
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Abstract
Frequency domain optical coherence tomography (FD-OCT) systems and methods are provided. Thereby, a first measurement and a second measurement is performed, wherein in the first measurement an object region is illuminated by measuring light having a spectrum with a first spectral width and in the second measurement the object region is illuminated with measuring light having a spectrum with a second spectral width, wherein the first spectral width is at least 10% greater than the second spectral width. Further, during the first measurement intensities of spectral ranges of light having interacted with the object and being superimposed with reference light are detected, wherein a width of these spectral ranges is greater than a corresponding width during the second measurement. Thus, switching an axial field of view of structural information of the object across a depth direction is enabled upon minimizing radiation damage at the object.