The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Dec. 21, 2007
Applicants:

Simon Prince, Newbury Park, CA (US);

Michael Sherwood, Agoura, CA (US);

Robert E. Fischer, Westlake Village, CA (US);

Syed Tariq Shafaat, Marina Del Rey, CA (US);

Shawn Mulcahey, Moorpark, CA (US);

Paul Hudson, Newbury Park, CA (US);

Greg Moeller, Moorpark, CA (US);

Gregory A. Williby, St. Johns, FL (US);

Russell T. Spaulding, St. Johns, FL (US);

John C. Hootman, Orange Park, FL (US);

Russell J. Edwards, Jacksonville, FL (US);

John Edward Greivenkamp, Jr., Tucson, AZ (US);

Inventors:

Simon Prince, Newbury Park, CA (US);

Michael Sherwood, Agoura, CA (US);

Robert E. Fischer, Westlake Village, CA (US);

Syed Tariq Shafaat, Marina Del Rey, CA (US);

Shawn Mulcahey, Moorpark, CA (US);

Paul Hudson, Newbury Park, CA (US);

Greg Moeller, Moorpark, CA (US);

Gregory A. Williby, St. Johns, FL (US);

Russell T. Spaulding, St. Johns, FL (US);

John C. Hootman, Orange Park, FL (US);

Russell J. Edwards, Jacksonville, FL (US);

John Edward Greivenkamp, Jr., Tucson, AZ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Modified MZ (Mach-Zender) interferometers are utilized to analyze the transmitted, aspherical wavefront of an ophthalmic lens by mounting the lens in a cuvette having a rotatable carousel that can hold multiple lenses. Fresh, temperature controlled, saline solution is circulated about the lenses, and the cuvette is positioned in a vertical test arm of the interferometer configuration. Reverse raytracing is utilized to remove aberrations induced into the wavefront as it is imaged from immediately behind the lens to the detector of the interferometer.


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