The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Apr. 10, 2006
Applicants:

Klaus Anderle, Darmstadt, DE;

Markus Hasenzahl, Riedstadt, DE;

Inventors:

Klaus Anderle, Darmstadt, DE;

Markus Hasenzahl, Riedstadt, DE;

Assignee:

GVBB Holdings S.A.R.L., Luxembourg, LU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 13/00 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for focussing a film scanner provides for selecting a plurality of partial regions of the picture to be scanned for the purpose of focus monitoring. During the focussing of one of the selected partial regions, the focussing of the other partial regions is simultaneously monitored. The monitoring is effected for example by simultaneous representation of the partial regions on a monitor screen, and/or by evaluation of the frequency and amplitude conditions of the partial regions. An optimum focal point is set if all the selected partial regions are simultaneously set sharply.


Find Patent Forward Citations

Loading…