The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Sep. 02, 2010
Applicant:

Sunder S. Kidambi, Austin, TX (US);

Inventor:

Sunder S. Kidambi, Austin, TX (US);

Assignee:

Intersil Americas Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for calibrating non-linearities of ADCs are described, which can be applied whether or not the non-linearities change with frequency. When the non-linearities do not change (are static), the frequency of a calibrating signal is first estimated coarsely in a calibration mode, then a fine estimate is determined using the coarse estimate. These estimates are then used to predict the sinusoidal signal using a linear predictor. A Look Up Table (LUT) containing corrections to the ADC is derived from this result. The LUT is then used in a normal operating mode to correct the output of the ADC. In a case where the characteristics of the non-linearities of the input signal are dynamic and thus change with frequency, a frequency spectrum of interest is broken into several regions. In each of these regions, a frequency is identified and used as a calibrating signal to generate the corresponding LUT. During normal operation of the ADC, in a first method, the bin corresponding to dominant frequency of the signal is identified using a short-length FFT. This bin is used to select the appropriate LUT for operating on the output of the ADC to provide the calibrated output. In a second method used when dynamic input is expected, a single LUT is developed using the averages values from the LUTs determined from the various regions.


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