The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Feb. 08, 2010
Applicants:

Emmanuelle Claude, Cheshire, GB;

Marten F. Snel, Cheshire, GB;

Johannes Petrus Cornelis Vissers, Huizen, NL;

Keith Richardson, Derbyshire, GB;

Inventors:

Emmanuelle Claude, Cheshire, GB;

Marten F. Snel, Cheshire, GB;

Johannes Petrus Cornelis Vissers, Huizen, NL;

Keith Richardson, Derbyshire, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 37/256 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention comprises a method of imaging of a substrate in which a sample of interest is first ionized at multiple known positions whereafter a mass spectrum of the ionized sample at each of the multiple known positions is produced using a Mass Spectrometer. An overall spectrum for the whole sample is then created, and a number of peaks within the overall spectrum is selected. A scan distribution for at least some of the selected peaks is created, and the scan distributions are compared to identify correlations between different analytes within the sample.


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