The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Aug. 19, 2010
Applicants:

Yoha Hwang, Seoul, KR;

Jong Min Lee, Gunpo-si, KR;

Inventors:

Yoha Hwang, Seoul, KR;

Jong Min Lee, Gunpo-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 9/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various embodiments of a method for monitoring a machine condition are provided. An embodiment of the present invention provides a method of monitoring a machine condition, comprising the following steps: modeling a normal signal model performed by detecting a signal for monitoring condition of a normal machine and converting the detected signal to a normal signal model in time domain using a hidden Markov model (HMM) algorithm; calculating a probability value data of the monitoring signal at a subject machine performed by detecting a signal for monitoring condition of the subject machine in real-time and converting the detected signal to the probability value data relative to the normal state signal model using the HMM algorithm; and determining a section having deficiency where the probability value data of the monitoring signal at the subject machinery is not maintained constantly relative to the normal signal model.


Find Patent Forward Citations

Loading…