The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Jun. 30, 2006
Applicants:

Steven Francis Leboeuf, Schenectady, NY (US);

Peter Micah Sandvik, Clifton Park, NY (US);

Radislav Alexandrovich Potyrailo, Niskayuna, NY (US);

Inventors:

Steven Francis LeBoeuf, Schenectady, NY (US);

Peter Micah Sandvik, Clifton Park, NY (US);

Radislav Alexandrovich Potyrailo, Niskayuna, NY (US);

Assignee:

Morpho Detection, Inc., Newark, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 31/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus includes an article and a detector. The article includes a substrate, a faceted structure disposed on the substrate, and a sensor layer disposed on the faceted structure. The faceted structure is disposed on the substrate first surface and itself has a surface. The faceted structure surface has peripheral edge defining a diameter of the faceted structure surface. The sensor layer is disposed on the faceted structure surface. The sensor layer can react or can interact with a target species when the target species is sufficiently proximate to the sensor layer. The sensor layer responds to the reaction or to the interaction in a detectable manner. The detector detects a response to the reaction, or to the interaction, of the target species with the sensor layer.


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