The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Mar. 28, 2008
Applicants:

Yuji Wakamiya, Kobe, JP;

Tomohiro Okuzaki, Himeji, JP;

Hisato Takehara, Kobe, JP;

Inventors:

Yuji Wakamiya, Kobe, JP;

Tomohiro Okuzaki, Himeji, JP;

Hisato Takehara, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 33/00 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample analyzer is disclosed that comprising: a first reagent container to hold a first reagent container with a first record section which contains a first reagent management information; a second reagent container holder to hold a second reagent container with a second record section which contains a second reagent management information; a first information reader; a second information reader; a registration section for registering the combination of the first reagent and the second reagent based on the first reagent management information; a measurement section for conducting a measurement of a predetermined analysis item by using the first reagent and the second reagent corresponding to the combination registered by the registration section; and a processing section for processing a measurement result obtained by the measurement section, and for obtaining an analysis result of the sample.


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