The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2013
Filed:
Oct. 08, 2009
Applicants:
Minsu Park, Yongin-Si, KR;
Jangmyong Woo, Yongin-Si, KR;
Gyungsub Kim, Suwon-Si, KR;
Sanghoon Choi, Yongin-Si, KP;
Inventors:
Minsu Park, Yongin-Si, KR;
Jangmyong Woo, Yongin-Si, KR;
Gyungsub Kim, Suwon-Si, KR;
Sanghoon Choi, Yongin-Si, KP;
Assignee:
Korea Plant Service & Engineering Co., Ltd, Gyeonggi-do, KR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
Abstract
An inspecting device including a detachable probe has a link structure, and thus a subject having various diameters is tested. In addition, since various probes are changeably used in a scanner housing, ultrasonic wave testing and eddy current testing are simultaneously performed.