The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Oct. 02, 2009
Applicants:

Christopher W. Crowley, San Diego, CA (US);

Erik Edmund Magnuson, Cardiff, CA (US);

Hacene Boudries, Andover, MA (US);

Inventors:

Christopher W. Crowley, San Diego, CA (US);

Erik Edmund Magnuson, Cardiff, CA (US);

Hacene Boudries, Andover, MA (US);

Assignee:

Morpho Detection, Inc., Newark, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of operating a screening system includes applying an electromagnetic field to a subject in a region at least partially enclosed by electromagnetic shielding, and measuring an output from a sensor. The output is representative of an interaction of the electromagnetic field and the subject. A trace vapor is collected from the subject within the region, and the trace vapor is identified. Based on the measured sensor output and the identified trace vapor, whether a target material is associated with the subject is determined.


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