The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2013

Filed:

May. 29, 2009
Applicants:

Naoki Fujii, Oumihachiman, JP;

Gaku Kamitani, Kyoto, JP;

Taichi Mori, Yasu, JP;

Inventors:

Naoki Fujii, Oumihachiman, JP;

Gaku Kamitani, Kyoto, JP;

Taichi Mori, Yasu, JP;

Assignee:

Murata Manufacturing Co., Ltd., Nagaokakyo-Shi, Kyoto-fu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electronic-component high-frequency characteristic error correcting method for allowing a calibration work to be performed on a two-terminal impedance component using the same correction-target measuring system as that used in actual measurement. At least three correction data acquisition samples having different high-frequency characteristics are measured by a reference measuring system and an actual measuring system. An equation for associating the value measured by the actual measuring system with the value measured by the reference measuring system using an error correction coefficient of a transmission line is determined. A given electronic component is measured by the actual measuring system. An estimated high-frequency characteristic value of the electronic component obtained when the electronic component is measured by the reference measuring system is calculated using the determined equation.


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